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    Author information
    First name: Degang
    Last name: Chen
    DBLP: 08/4236
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    Below you find the publications which have been written by this author.

    Show item 1 to 25 of 226  
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    Conference paper
    Yuming Zhuang, Benjamin Magstadt, Tao Chen, Degang Chen.
    High-Purity Sine Wave Generation Using Nonlinear DAC With Predistortion Based on Low-Cost Accurate DAC-ADC Co-Testing.
    IEEE Trans. Instrumentation and Measurement 2018, Volume 67 (0) 2018
    Journal article
    Qinghua Hu, Jusheng Mi, Degang Chen.
    Granular Computing Based Machine Learning in the Era of Big Data.
    Inf. Sci. 2017, Volume 378 (0) 2017
    Conference paper
    Xiaoxia Zhang, Degang Chen, Eric C. C. Tsang.
    Generalized dominance rough set models for the dominance intuitionistic fuzzy information systems.
    Inf. Sci. 2017, Volume 378 (0) 2017
    Journal article
    Yan-Yan Yang, Degang Chen, Hui Wang, Eric C. C. Tsang, Deli Zhang.
    Fuzzy rough set based incremental attribute reduction from dynamic data with sample arriving.
    Fuzzy Sets and Systems 2017, Volume 312 (0) 2017
    Conference paper
    Yuming Zhuang, Degang Chen.
    ADC Spectral Testing with Signal Amplitude Drift and Simultaneous Non-coherent Sampling.
    J. Electronic Testing 2017, Volume 33 (0) 2017
    Journal article
    Jingjing Song, Eric C. C. Tsang, Degang Chen, Xibei Yang.
    Minimal decision cost reduct in fuzzy decision-theoretic rough set model.
    Knowl.-Based Syst. 2017, Volume 126 (0) 2017
    Conference paper
    Shravan K. Chaganti, Li Xu, Degang Chen.
    A low-cost method for separation and accurate estimation of ADC noise, aperture jitter, and clock jitter.
    35th IEEE VLSI Test Symposium, VTS 2017, Las Vegas, NV, USA, April 9-12, 2017 2017 (0) 2017
    Conference paper
    Yan Duan, Degang Chen.
    Accurate jitter decomposition in high-speed links.
    35th IEEE VLSI Test Symposium, VTS 2017, Las Vegas, NV, USA, April 9-12, 2017 2017 (0) 2017
    Conference paper
    Yuming Zhuang, Li Xu, Degang Chen.
    Accurate Spectral Testing With Arbitrary Noncoherency in Sampling and Simultaneous Drifts in Amplitude and Frequency.
    IEEE Trans. Instrumentation and Measurement 2017, Volume 66 (0) 2017
    Conference paper
    You Li, Zhiqiang Liu, Degang Chen.
    Efficient Verification Against Undesired Operating Points for MOS Analog Circuits.
    IEEE Trans. on Circuits and Systems 2017, Volume 64 (0) 2017
    Conference paper
    Yan-Yan Yang, Degang Chen, Hui Wang.
    Active Sample Selection Based Incremental Algorithm for Attribute Reduction With Rough Sets.
    IEEE Trans. Fuzzy Systems 2017, Volume 25 (0) 2017
    Conference paper
    Changzhong Wang, Yali Qi, Ming-Wen Shao, Qinghua Hu, Degang Chen, Yuhua Qian, Yaojin Lin.
    A Fitting Model for Feature Selection With Fuzzy Rough Sets.
    IEEE Trans. Fuzzy Systems 2017, Volume 25 (0) 2017
    Conference paper
    Yuming Zhuang, Degang Chen.
    Algorithms for Accurate Spectral Analysis in the Presence of Arbitrary Noncoherency and Large Distortion.
    IEEE Trans. Instrumentation and Measurement 2017, Volume 66 (0) 2017
    Conference paper
    Zhiqiang Liu, Nanqi Liu, Shravan K. Chaganti, Degang Chen, Amitava Majumdar.
    A digital clock-less pulse stretcher with application in deep sub-nanosecond pulse detection.
    IEEE International Symposium on Circuits and Systems, ISCAS 2017, Baltimore, MD, USA, May 28-31, 2017 2017 (0) 2017
    Conference paper
    Zhiqiang Liu, Degang Chen.
    A voltage reference generator targeted at extracting the silicon bandgap Vgo from Vbe.
    IEEE International Symposium on Circuits and Systems, ISCAS 2017, Baltimore, MD, USA, May 28-31, 2017 2017 (0) 2017
    Conference paper
    Yuming Zhuang, Degang Chen.
    Accurate spectral testing of the signals with amplitude drift.
    IEEE International Symposium on Circuits and Systems, ISCAS 2017, Baltimore, MD, USA, May 28-31, 2017 2017 (0) 2017
    Conference paper
    Yuming Zhuang, Degang Chen.
    Accurate Spectral Testing With Non-Coherent Sampling for Multi-Tone Test.
    IEEE Trans. on Circuits and Systems 2017, Volume 64 (0) 2017
    Conference paper
    Xiankun Jin, Tao Chen, Mayank Jain, Arun Kumar Barman, David Kramer, Doug Garrity, Randall L. Geiger, Degang Chen.
    An on-chip ADC BIST solution and the BIST enabled calibration scheme.
    IEEE International Test Conference, ITC 2017, Fort Worth, TX, USA, October 31 - Nov. 2, 2017 2017 (0) 2017
    Conference paper
    Li Xu, Yuming Zhuang, Rajavelu Thinakaran, Kenneth M. Butler, Degang Chen.
    Accurate ADC testing with significantly relaxed instrumentation including large cumulative jitter.
    IEEE International Test Conference, ITC 2017, Fort Worth, TX, USA, October 31 - Nov. 2, 2017 2017 (0) 2017
    Conference paper
    Yuming Zhuang, Degang Chen.
    Accurate and robust spectral testing with relaxed instrumentation requirements.
    IEEE International Test Conference, ITC 2017, Fort Worth, TX, USA, October 31 - Nov. 2, 2017 2017 (0) 2017
    Conference paper
    Yan Duan, Tao Chen, Degang Chen.
    A Low-cost Dithering Method for Improving ADC Linearity Test Applied in uSMILE Algorithm.
    J. Electronic Testing 2017, Volume 33 (0) 2017
    Conference paper
    Eric C. C. Tsang, Qinghua Hu, Degang Chen.
    Feature and instance reduction for PNN classifiers based on fuzzy rough sets.
    Int. J. Machine Learning Cybernetics 2016, Volume 7 (0) 2016
    Journal article
    Xiao Zhang, Changlin Mei, Degang Chen, Jinhai Li.
    Feature selection in mixed data: A method using a novel fuzzy rough set-based information entropy.
    Pattern Recognition 2016, Volume 56 (0) 2016
    Conference paper
    Yuming Zhuang, Degang Chen.
    Accurate spectral testing with non-coherent sampling for large distortion to noise ratios.
    34th IEEE VLSI Test Symposium, VTS 2016, Las Vegas, NV, USA, April 25-27, 2016 2016 (0) 2016
    Conference paper
    Yuming Zhuang, Tao Chen, Shravan K. Chaganti, Degang Chen.
    Accurate linearity testing with impure sinusoidal stimulus robust against flicker noise.
    34th IEEE VLSI Test Symposium, VTS 2016, Las Vegas, NV, USA, April 25-27, 2016 2016 (0) 2016
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    Your query returned 226 matches in the database.