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    Author information
    First name: Sean J.
    Last name: O'Shea
    DBLP: 20/8457
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    Conference paper
    Kalya Shubhakar, Sen Mei, Michel Bosman, Nagarajan Raghavan, A. Ranjan, Sean J. O'Shea, Kin Leong Pey.
    Conductive filament formation at grain boundary locations in polycrystalline HfO
    Microelectronics Reliability 2016, Volume 64 (0) 2016
    Conference paper
    A. Ranjan, Nagarajan Raghavan, Joel Molina Reyes, Sean J. O'Shea, Kalya Shubhakar, Kin Leong Pey.
    Analysis of quantum conductance, read disturb and switching statistics in HfO
    Microelectronics Reliability 2016, Volume 64 (0) 2016
    Conference paper
    Kalya Shubhakar, Michel Bosman, O. A. Neucheva, Y. C. Loke, Nagarajan Raghavan, R. Thamankar, A. Ranjan, Sean J. O'Shea, Kin Leong Pey.
    An SEM/STM based nanoprobing and TEM study of breakdown locations in HfO
    Microelectronics Reliability 2015, Volume 55 (0) 2015
    Conference paper
    Kalya Shubhakar, Nagarajan Raghavan, Sunil Singh Kushvaha, Michel Bosman, Zhongrui Wang, Sean J. O'Shea, Kin Leong Pey.
    Impact of local structural and electrical properties of grain boundaries in polycrystalline HfO
    Microelectronics Reliability 2014, Volume 54 (0) 2014
    Conference paper
    Arijit Roy, Cher Ming Tan, Sean J. O'Shea, Kedar Hippalgaonkar, Wulf Hofbauer.
    Room temperature observation of point defect on gold surface using thermovoltage mapping.
    Microelectronics Reliability 2007, Volume 47 (0) 2007
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