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First name:	Ding-Ming
Last name:	Kwai
DBLP:	25/3970
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	Conference paper Chi-Wen Pan, Yu-Min Lee, Pei-Yu Huang, Chi-Ping Yang, Chang-Tzu Lin, Chia-Hsin Lee, Yung-Fa Chou, Ding-Ming Kwai. I-LUTSim: An iterative look-up table based thermal simulator for 3-D ICs.	18th Asia and South Pacific Design Automation Conference, ASP-DAC 2013, Yokohama, Japan, January 22-25, 2013 2013	(0)	2013
	Conference paper Pei-Wen Luo, Chun Zhang, Yung-Tai Chang, Liang-Chia Cheng, Hung-Hsie Lee, Bih-Lan Sheu, Yu-Shih Su, Ding-Ming Kwai, Yiyu Shi. Benchmarking for research in power delivery networks of three-dimensional integrated circuits.	International Symposium on Physical Design, ISPD'13, Stateline, NV, USA, March 24-27, 2013 2013	(0)	2013
	Conference paper Ji-Wei Ker, Shi-Yu Huang, Chao-Wen Tzeng, Ding-Ming Kwai, Yung-Fa Chou. Die-to-Die Clock Synchronization for 3-D IC Using Dual Locking Mechanism.	IEEE Trans. on Circuits and Systems 2013, Volume 60	(0)	2013
	Conference paper Hsiu-Ming Chang, Jiun-Lang Huang, Ding-Ming Kwai, Kwang-Ting Cheng, Cheng-Wen Wu. Low-Cost Error Tolerance Scheme for 3-D CMOS Imagers.	IEEE Trans. VLSI Syst. 2013, Volume 21	(0)	2013
	Conference paper Jhih-Wei You, Shi-Yu Huang, Yu-Hsiang Lin, Meng-Hsiu Tsai, Ding-Ming Kwai, Yung-Fa Chou, Cheng-Wen Wu. In-Situ Method for TSV Delay Testing and Characterization Using Input Sensitivity Analysis.	IEEE Trans. VLSI Syst. 2013, Volume 21	(0)	2013
	Conference paper Yu-Hsiang Lin, Shi-Yu Huang, Kun-Han Tsai, Wu-Tung Cheng, Stephen K. Sunter, Yung-Fa Chou, Ding-Ming Kwai. Parametric Delay Test of Post-Bond Through-Silicon Vias in 3-D ICs via Variable Output Thresholding Analysis.	IEEE Trans. on CAD of Integrated Circuits and Systems 2013, Volume 32	(0)	2013
	Conference paper Yun-Chao You, Che-Wei Chou, Jin-Fu Li, Chih-Yen Lo, Ding-Ming Kwai, Yung-Fa Chou, Cheng-Wen Wu. A built-in self-test scheme for 3D RAMs.	2012 IEEE International Test Conference, ITC 2012, Anaheim, CA, USA, November 5-8, 2012 2012	(0)	2012
	Conference paper Xuan-Lun Huang, Jiun-Lang Huang, Hung-I Chen, Chang-Yu Chen, Tseng Kuo-Tsai, Ming-Feng Huang, Yung-Fa Chou, Ding-Ming Kwai. An MCT-Based Bit-Weight Extraction Technique for Embedded SAR ADC Testing and Calibration.	J. Electronic Testing 2012, Volume 28	(0)	2012
	Conference paper Jiun-Lang Huang, X.-L. Huang, Yung-Fa Chou, Ding-Ming Kwai. A SAR ADC missing-decision level detection and removal technique.	30th IEEE VLSI Test Symposium, VTS 2012, Maui, Hawaii, USA, 23-26 April 2012 2012	(0)	2012
	Conference paper Shi-Yu Huang, Yu-Hsiang Lin, Kun-Han Tsai, Wu-Tung Cheng, Stephen K. Sunter, Yung-Fa Chou, Ding-Ming Kwai. Small delay testing for TSVs in 3-D ICs.	The 49th Annual Design Automation Conference 2012, DAC '12, San Francisco, CA, USA, June 3-7, 2012 2012	(0)	2012

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