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    Author information
    First name: Frankie
    Last name: Low
    DBLP: 26/4160
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    Conference paper
    Cher Ming Tan, Wei Li, Kok Tong Tan, Frankie Low.
    Development of highly accelerated electromigration test.
    Microelectronics Reliability 2006, Volume 46 (0) 2006
    Conference paper
    Cher Ming Tan, Arijit Roy, Kok Tong Tan, Derek Sim Kwang Ye, Frankie Low.
    Effect of vacuum break after the barrier layer deposition on the electromigration performance of aluminum based line interconnects.
    Microelectronics Reliability 2005, Volume 45 (0) 2005
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    Your query returned 2 matches in the database.