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    Author information
    First name: Cher Ming
    Last name: Tan
    DBLP: 40/3133
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    Below you find the publications which have been written by this author.

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    Conference paper
    Preetpal Singh, Cher Ming Tan.
    Uncover the Degradation Science of Silicone Under the Combined Temperature and Humidity Conditions.
    IEEE Access 2018, Volume 6 (0) 2018
    Journal article
    Marvin Chan, Cher Ming Tan, Kheng Chooi Lee, Chuan Seng Tan.
    Non-destructive degradation study of copper wire bond for its temperature cycling reliability evaluation.
    Microelectronics Reliability 2016, Volume 61 (0) 2016
    Conference paper
    A. Asenov, Ulf Schlichtmann, Cher Ming Tan, Hei Wong, Xing Zhou.
    Editorial.
    Microelectronics Reliability 2016, Volume 61 (0) 2016
    Conference paper
    Preetpal Singh, Cher Ming Tan, Liann-Be Chang.
    Early degradation of high power packaged LEDs under humid conditions and its recovery - Myth of reliability rejuvenation.
    Microelectronics Reliability 2016, Volume 61 (0) 2016
    Conference paper
    Preetpal Singh, Cher Ming Tan.
    A review on the humidity reliability of high power white light LEDs.
    Microelectronics Reliability 2016, Volume 61 (0) 2016
    Conference paper
    Udit Narula, Cher Ming Tan, Chao-Sung Lai.
    Copper induced synthesis of graphene using amorphous carbon.
    Microelectronics Reliability 2016, Volume 61 (0) 2016
    Journal article
    Song Lan, Cher Ming Tan, Kevin Wu.
    Methodology of reliability enhancement for high power LED driver.
    Microelectronics Reliability 2014, Volume 54 (0) 2014
    Journal article
    Cher Ming Tan, Wen Zhi Yu.
    Damage threshold determination and non-destructive identification of possible failure sites in PIN limiter.
    Microelectronics Reliability 2014, Volume 54 (0) 2014
    Journal article
    A. Asenov, Ulf Schlichtmann, Cher Ming Tan, Hei Wong, Xing Zhou.
    Special section reliability and variability of devices for circuits and systems.
    Microelectronics Reliability 2014, Volume 54 (0) 2014
    Journal article
    Xiangchen Chen, Cher Ming Tan.
    Modeling and analysis of gate-all-around silicon nanowire FET.
    Microelectronics Reliability 2014, Volume 54 (0) 2014
    Show item 1 to 44 of 44  

    Your query returned 44 matches in the database.