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    Author information
    First name: Yuejin
    Last name: Hou
    DBLP: 59/8553
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    Journal article
    Arijit Roy, Yuejin Hou, Cher Ming Tan.
    Electromigration in width transition copper interconnect.
    Microelectronics Reliability 2009, Volume 49 (0) 2009
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