Publications :: Search

Show author

On this page you see the details of the selected author.

    Author information
    First name: Derek Sim Kwang
    Last name: Ye
    DBLP: 82/373
    Rating: (not rated yet)

    Below you find the publications which have been written by this author.

    Show item 1 to 2 of 2  
    Select a publication
    Show Title Venue Rating Date
    Conference paper
    Cher Ming Tan, Arijit Roy, Kok Tong Tan, Derek Sim Kwang Ye, Frankie Low.
    Effect of vacuum break after the barrier layer deposition on the electromigration performance of aluminum based line interconnects.
    Microelectronics Reliability 2005, Volume 45 (0) 2005
    Conference paper
    Guan Zhang, Cher Ming Tan, Kok Tong Tan, Derek Sim Kwang Ye, W. Y. Zhang.
    Reliability Improvement in Al Metallization: A Combination of Statistical Prediction and Failure Analytical Methodology.
    Microelectronics Reliability 2004, Volume 44 (0) 2004
    Show item 1 to 2 of 2  

    Your query returned 2 matches in the database.