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    Author information
    First name: Yeong-Jar
    Last name: Chang
    DBLP: 87/4590
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    Conference paper
    Yu-Shih Su, Wing-Kai Hon, Cheng-Chih Yang, Shih-Chieh Chang, Yeong-Jar Chang.
    Clock Skew Minimization in Multi-Voltage Mode Designs Using Adjustable Delay Buffers.
    IEEE Trans. on CAD of Integrated Circuits and Systems 2010, Volume 29 (0) 2010
    Conference paper
    Yu-Shih Su, Wing-Kai Hon, Cheng-Chih Yang, Shih-Chieh Chang, Yeong-Jar Chang.
    Value assignment of adjustable delay buffers for clock skew minimization in multi-voltage mode designs.
    2009 International Conference on Computer-Aided Design (ICCAD'09), November 2-5, 2009, San Jose, CA, USA 2009 (0) 2009
    Conference paper
    Ming-Dou Ker, Po-Yen Chiu, Fu-Yi Tsai, Yeong-Jar Chang.
    On the Design of Power-rail ESD Clamp Circuit with Consideration of Gate Leakage Current in 65-nm Low-voltage CMOS Process.
    International Symposium on Circuits and Systems (ISCAS 2009), 24-17 May 2009, Taipei, Taiwan 2009 (0) 2009
    Conference paper
    Chung-Fu Lin, Chia-Fu Huang, De-Chung Lu, Chih-Chiang Hsu, Wen-Tsung Chiu, Yu-Wei Chen, Yeong-Jar Chang.
    A Low-Cost Programmable Memory BIST Design for Multiple Memory Instances.
    2008 IEEE International Test Conference, ITC 2008, Santa Clara, California, USA, October 26-31, 2008 2008 (0) 2008
    Conference paper
    Ming Shae Wu, Chung-Len Lee, Yeong-Jar Chang, Wen Ching Wu.
    Crosstalk Fault Detection for Interconnection Lines Based on Path Delay Inertia Principle.
    14th Asian Test Symposium (ATS 2005), 18-21 December 2005, Calcutta, India 2005 (0) 2005
    Conference paper
    Rei-Fu Huang, Chin-Lung Su, Cheng-Wen Wu, Shen-Tien Lin, Kun-Lun Luo, Yeong-Jar Chang.
    Fail Pattern Identification for Memory Built-In Self-Repair.
    13th Asian Test Symposium (ATS 2004), 15-17 November 2004, Kenting, Taiwan 2004 (0) 2004
    Conference paper
    Chin-Lung Su, Rei-Fu Huang, Cheng-Wen Wu, Chien-Chung Hung, Ming-Jer Kao, Yeong-Jar Chang, Wen Ching Wu.
    MRAM Defect Analysis and Fault Modeli.
    Proceedings 2004 International Test Conference (ITC 2004), October 26-28, 2004, Charlotte, NC, USA 2003 (0) 2004
    Conference paper
    Li-Ming Denq, Rei-Fu Huang, Cheng-Wen Wu, Yeong-Jar Chang, Wen Ching Wu.
    A Parallel Built-in Diagnostic Scheme for Multiple Embedded Memories.
    12th IEEE International Workshop on Memory Technology, Design, and Testing (MTDT 2004), 9-10 August 2004, San Jose, CA, USA 2004 (0) 2004
    Conference paper
    Yeong-Jar Chang, Chung-Len Lee, Jwu E. Chen, Chauchin Su.
    A Behavior-Level Fault Model for the Closed-Loop Operational Amplifier.
    J. Inf. Sci. Eng. 2000, Volume 16 (0) 2000
    Conference paper
    Yeong-Jar Chang, Chung-Len Lee.
    Synthesis of Multi-Variable MVL Funtions Using Hybrid Mode CMOS Logic.
    ISMVL 1994 (0) 1994
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