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Defect Classification of Electronic Circuit Board Using SVM based on Random Sampling.

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    Title: Defect Classification of Electronic Circuit Board Using SVM based on Random Sampling.
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    Date: 2014
    Publication type: Conference paper
    Authors:
    No. First name Last name Show
    1. Hiroaki Hagi
    2. Yuji Iwahori
    3. Shinji Fukui
    4. Yoshinori Adachi
    5. Manas Kamal Bhuyan
    Download (by DOI): 10.1016/j.procs.2014.08.218
    BibTeX: conf/kes/HagiIFAB14
    DBLP: db/conf/kes/kes2014.html#HagiIFAB14
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    Conference
    Name: 18th International Conference in Knowledge Based and Intelligent Information and Engineering Systems, KES 2014, Gdynia, Poland, 15-17 September 2014 2014
    URL: http://www.sciencedirect.com/science/journal/18770509/35
    DBLP: db/conf/kes/kes2014.html