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    Journal
    Name: IEEE T. Instrumentation and Measurement
    Year: 1998
    Volume: 47
    Number: 1
    DBLP: db/journals/tim/tim47.html
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    Below you find the publications assigned to this venue.

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    Journal article
    Josep Samitier, Manel Puig-Vidal, Sebastiàn A. Bota, Carles Rubio, Stilianos Siskos, Theodore Laopoulos.
    A current-mode interface circuit for a piezoresistive pressure sensor.
    IEEE T. Instrumentation and Measurement 1998, Volume 47 (0) 1998
    Journal article
    Stephan Spiess, Markus Vincze, Minu Ayromlou.
    On the calibration of a 6-D laser tracking system for dynamic robot measurements.
    IEEE T. Instrumentation and Measurement 1998, Volume 47 (0) 1998
    Journal article
    Rob Otte, Leo P. De Jong, Arthur H. M. van Roermund.
    Wireless optical PPM telemetry and the influence of lighting flicker.
    IEEE T. Instrumentation and Measurement 1998, Volume 47 (0) 1998
    Journal article
    Xiujun Li, Gerard C. M. Meijer, Erik J. Schnitger.
    A novel smart interface for voltage-generating sensors.
    IEEE T. Instrumentation and Measurement 1998, Volume 47 (0) 1998
    Conference paper
    Ignacio Santamaría, Carlos J. Pantaleon-Prieto, Jesús Ibáñez 0002, Enrique Gomez-Cosio.
    Improved procedures for estimating amplitudes and phases of harmonics with application to vibration analysis.
    IEEE T. Instrumentation and Measurement 1998, Volume 47 (0) 1998
    Journal article
    Alessandro Ferrero, Roberto Ottoboni.
    A new low-cost voltage-to-voltage transducer for distorted signals.
    IEEE T. Instrumentation and Measurement 1998, Volume 47 (0) 1998
    Journal article
    Philip G. Jr. Bartley, Stuart O. Nelson, Ronald W. McClendon, Samir Trabelsi.
    Determining moisture content of wheat with an artificial neural network from microwave transmission measurements.
    IEEE T. Instrumentation and Measurement 1998, Volume 47 (0) 1998
    Journal article
    T. Michael Souders.
    Code probability distributions of A/D converters with random input noise.
    IEEE T. Instrumentation and Measurement 1998, Volume 47 (0) 1998
    Journal article
    Giulio Fedi, Antonio Luchetta, Stefano Manetti, Maria Cristina Piccirilli.
    A new symbolic method for analog circuit testability evaluation.
    IEEE T. Instrumentation and Measurement 1998, Volume 47 (0) 1998
    Journal article
    Takao Sugimoto, Tadao Kawaguchi.
    Development of a surface defect inspection system using radiant light from steel products in a hot rolling line.
    IEEE T. Instrumentation and Measurement 1998, Volume 47 (0) 1998
    Show item 1 to 10 of 259  

    Your query returned 259 matches in the database.